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    • Affect of annealing on uniform and nonuniform strains in a sputtered Mo film on Si 

      Adler, Thomas; Houska, Charles R. (American Institute of Physics, 1979)
      Sputtered films of 1.5 μm of Mo deposited on (111) ‐oriented Si failed either by blistering or localized eruptions after various thermal treatments. Investigations were carried out to determine the amount of strain in the ...
    • Simplifications in the x‐ray line‐shape analysis 

      Adler, Thomas; Houska, Charles R. (American Institute of Physics, 1979)
      It is shown that a Fourier series associated with the Warren‐Averbach line‐shape analysis can be fitted with only five parameters to a pair of peaks. These interrelate the Fourier coefficients and thereby provide a simplified ...