The E-algorithm: an automatic test generation algorithm for hardware description languages

Traditional test generation techniques for digital circuits have been rendered inadequate by the increasing levels of integration achieved by VLSI technology. This thesis presents a test generation algorithm, the E-algorithm, that generates tests for circuits described using the VHDL Hardware Description Language. A fault model has been developed that addresses data path faults, faults in control structures, and faults in functional operators. The E-algorithm is able to generate tests for all modeled fault types, and handles a wide variety of circuit types, including sequential circuits. The algorithm has been implemented; preliminary results are given.