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    A diffusion-viscous analysis and experimental verification of defect formation in sintered silver bond-line 

    Xiao, Kewei; Ngo, Khai D. T.; Lu, Guo-Quan (Cambridge University Press, 2014-04-01)
    The low-temperature joining technique (LTJT) by silver sintering is being implemented by major manufacturers of power electronic devices and modules for bonding power semiconductor chips. A common die-attach material used ...

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    Content TypeArticle - Refereed (1)Subject
    Bonding (1)
    Kinetics (1)Materials science, multidisciplinary (1)Models (1)Paste (1)... View MoreDate Issued2014 (1)AuthorLu, Guo-Quan (1)Ngo, Khai D. T. (1)Xiao, Kewei (1)Has File(s)Yes (1)

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

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