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    Superjunction Power Transistors With Interface Charges: A Case Study for GaN 

    Ma, Yunwei; Xiao, Ming; Zhang, Ruizhe; Wang, Han; Zhang, Yuhao (2019-12-13)
    Recent progress in p-GaN trench-filling epitaxy has shown promise for the demonstration of GaN superjunction (SJ) devices. However, the presence of n-type interface charges at the regrowth interfaces has been widely observed. ...

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    Content TypeArticle - Refereed (1)Subject
    device simulation (1)
    gallium nitride (1)interface charges (1)interface impurities (1)
    Power electronics (1)
    ... View MoreDate Issued2019 (1)AuthorMa, Yunwei (1)Wang, Han (1)Xiao, Ming (1)Zhang, Ruizhe (1)Zhang, Yuhao (1)Has File(s)Yes (1)

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

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