Now showing items 1-2 of 2

    • Characterization of Ferroelectric Films by Spectroscopic Ellipsometry 

      Dickerson, Bryan Douglas (Virginia Tech, 2003-07-18)
      Process dependent microstructural effects in ferroelectric SrBi2Ta2O9 (SBT) thin films were characterized and distinguished from material dependent optical properties using a systematic multi-layer modeling technique. ...
    • Characterization of Ferroelectric Films by Spectroscopic Ellipsometry 

      Dickerson, Bryan Douglas Jr. (Virginia Tech, 1997-09-10)
      Process dependent microstructural effects in ferroelectric SrBi2Ta2O9 (SBT) thin films were characterized and distinguished from material dependent optical properties using a systematic multi-layer modeling technique. ...