Fundamental mechanisms of focused ion beam guided anodization
dc.contributor | Virginia Tech. Department of Materials Science and Engineering | en |
dc.contributor.author | Tian, Zhipeng | en |
dc.contributor.author | Lu, Kathy | en |
dc.contributor.author | Chen, Bo | en |
dc.contributor.department | Materials Science and Engineering (MSE) | en |
dc.date.accessed | 2015-04-24 | en |
dc.date.accessioned | 2015-05-21T19:47:24Z | en |
dc.date.available | 2015-05-21T19:47:24Z | en |
dc.date.issued | 2010-11-01 | en |
dc.description.abstract | This paper is focused on understanding the fundamental mechanisms of focused ion beam guided anodization and the unique capabilities of generating new patterns based on such an understanding. By designing proper interpore distance, pore arrangement, and pore shape during focused ion beam patterning, nonspherical pore shape and nonhexagonal patterns can be obtained by further anodization. The electrical field and the mechanical stress field around each focused ion beam patterned concave dictate the pore formation and growth. The oxide barrier layer thickness and shape around the focused ion beam guided pores affect new pore formation and the meshing of different size pores. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3500513] | en |
dc.description.sponsorship | National Science Foundation (U.S.) - Grant No. CMMI-0824741 | en |
dc.description.sponsorship | Virginia Tech. Institute for Critical Technology and Applied Science | en |
dc.format.extent | 8 pages | en |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Tian, Zhipeng, Lu, Kathy, Chen, Bo (2010). Fundamental mechanisms of focused ion beam guided anodization. Journal of Applied Physics, 108(9). doi: 10.1063/1.3500513 | en |
dc.identifier.doi | https://doi.org/10.1063/1.3500513 | en |
dc.identifier.issn | 0021-8979 | en |
dc.identifier.uri | http://hdl.handle.net/10919/52426 | en |
dc.identifier.url | http://scitation.aip.org/content/aip/journal/jap/108/9/10.1063/1.3500513 | en |
dc.language.iso | en_US | en |
dc.publisher | American Institute of Physics | en |
dc.rights | In Copyright | en |
dc.rights.uri | http://rightsstatements.org/vocab/InC/1.0/ | en |
dc.subject | Focused ion beam technology | en |
dc.subject | Surface patterning | en |
dc.subject | Aluminium | en |
dc.subject | Electrolytes | en |
dc.subject | Dissolution | en |
dc.title | Fundamental mechanisms of focused ion beam guided anodization | en |
dc.title.serial | Journal of Applied Physics | en |
dc.type | Article - Refereed | en |
dc.type.dcmitype | Text | en |
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