Effects of thermal and electrical histories on hard piezoelectrics: A comparison of internal dipolar fields and external dc bias

Simple item page
dc.contributorVirginia Tech. Department of Materials Science and Engineeringen
dc.contributorHitchiner Manufacturing, Inc.en
dc.contributorPenn State. International Center for Actuators and Transducers. Materials Research Instituteen
dc.contributor.authorGao, Yongkangen
dc.contributor.authorUchino, Kenjien
dc.contributor.authorViehland, Dwight D.en
dc.contributor.departmentMaterials Science and Engineering (MSE)en
dc.date.accessed2015-04-24en
dc.date.accessioned2015-05-21T19:47:30Zen
dc.date.available2015-05-21T19:47:30Zen
dc.date.issued2007-03-01en
dc.description.abstractRare earth modified Pb(Zr,Ti)O-3-Pb(Sb,Mn)O-3 piezoelectric ceramics have been studied for various thermal and electrical histories. In both "freshly" poled and unpoled conditions, thermal quenching was found to increase the remnant polarization (P-r) and induced strain of hard piezoelectrics, relative to that of annealed condition. A "pinched" double-loop P-E response was found in the aged unpoled condition, whereas a single P-E loop was observed after the quenching near Curie temperature. Investigations of the effect of an applied dc bias on the P-E and epsilon-E responses of hard piezoelectrics were also performed. In the unpoled and quenched condition, dc bias resulted in asymmetric P-E responses and a shift of the response along the E axis. Systematic investigations revealed that internal dipolar fields and applied positive dc biases have the same effect on domain dynamics. Large internal dipolar field is essential for high power performance. A fabrication method of quenching hard piezoelectrics near the Curie temperature before poling is proposed to enhance the induced polarization and strain levels. (c) 2007 American Institute of Physics.en
dc.description.sponsorshipUnited States. Office of Naval Research - Contract Nos. N00014-99-J-0754, N000140210340, N000140210126en
dc.description.sponsorshipUnited States. Office of Naval Research. Multidisciplinary University Research Initiatives (MURI) - MURI N0000140110761en
dc.format.extent7 pagesen
dc.format.mimetypeapplication/pdfen
dc.identifier.citationGao, Yongkang, Uchino, Kenji, Viehland, Dwight (2007). Effects of thermal and electrical histories on hard piezoelectrics: A comparison of internal dipolar fields and external dc bias. Journal of Applied Physics, 101(5). doi: 10.1063/1.2560909en
dc.identifier.doihttps://doi.org/10.1063/1.2560909en
dc.identifier.issn0021-8979en
dc.identifier.urihttp://hdl.handle.net/10919/52470en
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/101/5/10.1063/1.2560909en
dc.language.isoen_USen
dc.publisherAmerican Institute of Physicsen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectPiezoelectric transducersen
dc.subjectAnnealingen
dc.subjectPolarizationen
dc.subjectPiezoelectricityen
dc.subjectPiezoelectric fieldsen
dc.titleEffects of thermal and electrical histories on hard piezoelectrics: A comparison of internal dipolar fields and external dc biasen
dc.title.serialJournal of Applied Physicsen
dc.typeArticle - Refereeden
dc.type.dcmitypeTexten

Files

Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
2007_Effects_thermal_electrical_histories.pdf
Size:
1.22 MB
Format:
Adobe Portable Document Format
Download

Collections

Scholarly Works, Materials Science and Engineering (MSE)