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    Absolute coverage measurements of ultrathin alkali-metal films on reconstructed silicon 

    Banerjee, Rajarshi (2001)
    Metal/semiconductor interfaces, particularly those involving Si, are of great technological and scientific interest. In atomically abrupt interfaces, many properties are determined by interatomic interactions over a few ...

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    Department
    Physics (1)
    Subjectalkali metals (1)boronated (1)cesium (1)
    characterization (1)
    doped (1)... View MoreDate Issued2001 (1)Thesis Degree Leveldoctoral (1)Has File(s)Yes (1)

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

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