Browsing Bradley Department of Electrical and Computer Engineering by Author "Ha, Dong S."
Now showing items 1-2 of 2
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An Efficient Automatic Test Pattern Generator forStuck-Open Faults in CMOS Combinational Circuits
(Hindawi, 1994-01-01)In this paper, we describe a highly efficient automatic test pattern generator for stuck-open (SOP) faults, calledSOPRANO, in CMOS combinational circuits. The key idea of SOPRANO is to convert a CMOS circuit into anequivalent ... -
A new characterization method for delay and power dissipation of standard library cells
(Hindawi Publishing Corporation, 2002-11-01)A simplified method for characterization of standard library cells based on the linear delay model is presented in this paper. The linear model is chosen as it allows rapid characterization with a modest number of simulations, ...
