Sframe: An Efficient System for Detailed DC Simulation of Bipolar Analog Integrated Circuits Using Continuation Methods
Melville, Robert C.
Watson, Layne T.
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In this paper we describe an experimental system called sframe which is being incorporated into the design for manufacturability initiative at the Reading Works of AT&T Bell Laboratories. Our system is able to perform detailed and accurate DC analyses of integrated circuits containing several hundred transistors to be fabricated in a relatively complex junction isolated complementary technology.