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dc.contributor.authorLiu, Xiangdongen_US
dc.contributor.authorEhrich, Roger W.en_US
dc.date.accessioned2013-06-19T14:37:11Z
dc.date.available2013-06-19T14:37:11Z
dc.date.issued1993-06-01
dc.identifierhttp://eprints.cs.vt.edu/archive/00000353/en_US
dc.identifier.urihttp://hdl.handle.net/10919/19832
dc.descriptionThis paper concerns the problem of obtaining subpixel estimates of the locations of straight lines in digital images for purposes of machine vision. In particular, it presents a dithering method for improving the estimation accuracy on a rectangular sampling lattice. By adding uniformly distributed independent random noise it is shown that estimation bias may be removed and that the estimation variance is inversely proportional to the length of the line segment. The sensitivity to incorrect dither amplitude is calculated, and a novel approach is given for adding the dither by using grey-level image sensor and utilizing the imaging model.en_US
dc.format.mimetypeapplication/pdfen_US
dc.publisherDepartment of Computer Science, Virginia Polytechnic Institute & State Universityen_US
dc.relation.ispartofHistorical Collection(Till Dec 2001)en_US
dc.titleSubpixel Edge Location in Binary Images Using Ditheringen_US
dc.typeTechnical reporten_US
dc.identifier.trnumberTR-93-11en_US
dc.type.dcmitypeTexten_US
dc.identifier.sourceurlhttp://eprints.cs.vt.edu/archive/00000353/01/TR-93-11.pdf


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