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    • Raman-scattering and optical studies of argon-etched GaAs surfaces 

      Feng, G. F.; Zallen, R.; Epp, J. M.; Dillard, J. G. (American Physical Society, 1991-04)
      We have studied the structual damage in low-energy argon-ion-bombarded (ion-etched) GaAs using Raman scattering and ultraviolet reflectivity. When combined with post-bombardment sequential chemical etching, the Raman results ...