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    • Induced nanoscale deformations in polymers using atomic force microscopy 

      Lyuksyutov, S. F.; Paramonov, P. B.; Sharipov, R. A.; Sigalov, G. (American Physical Society, 2004-11-19)
      An exact analytical solution, based on the method of images, is obtained for the description of the electric field between an atomic force microscope (AFM) tip and a thin dielectric polymer film (30 nm thick) spin coated ...