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dc.contributorVirginia Techen_US
dc.contributor.authorYan, Y. K.en_US
dc.contributor.authorZhou, Y.en_US
dc.contributor.authorGupta, Sanjayen_US
dc.contributor.authorPriya, Shashanken_US
dc.date.accessioned2014-01-21T19:28:08Z
dc.date.available2014-01-21T19:28:08Z
dc.date.issued2013-08-01
dc.identifier.citationYan, Yongke; Zhou, Yuan; Gupta, Shashaank; et al., "Fatigue mechanism of textured Pb(Mg1/3Nb2/3)O-3-PbTiO3 ceramics," Appl. Phys. Lett. 103, 082906 (2013); http://dx.doi.org/10.1063/1.4819223
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/10919/24956
dc.description.abstractGrain orientation, BaTiO3 heterogeneous template content, and electrode materials are expected to play an important role in controlling the polarization fatigue behavior of < 001 > textured Pb(Mg1/3Nb2/3)O-3-PbTiO3 ceramics. A comparative analysis with randomly oriented ceramics showed that < 001 > grain orientation/texture exhibits improved fatigue characteristics due to the reduced switching activation energy and high domain mobility. The hypothesis was validated from the systematic characterization of polarization-electric field behavior and domain wall density. The defect accumulation at the grain boundary and clamping effect arising from the presence of BaTiO3 heterogeneous template in the final microstructure was found to be the main cause for polarization degradation in textured ceramic. (C) 2013 AIP Publishing LLC.
dc.description.sponsorshipOffice of Basic Energy Science, Department of Energy DE-FG02-07ER46480
dc.description.sponsorshipNSF I/UCRC: Center for Energy Harvesting Materials and Systems (CEHMS)
dc.language.isoen_US
dc.publisherAIP Publishing
dc.subjectFerroelectric single-crystalsen_US
dc.subjectPZT ceramicsen_US
dc.subjectCrack-growthen_US
dc.subjectBehavioren_US
dc.subjectOrientationen_US
dc.subjectPhysicsen_US
dc.titleFatigue mechanism of textured Pb(Mg1/3Nb2/3)O-3-PbTiO3 ceramicsen_US
dc.typeArticleen_US
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/apl/103/8/10.1063/1.4819223
dc.date.accessed2014-01-10
dc.title.serialApplied Physics Letters
dc.identifier.doihttps://doi.org/10.1063/1.4819223
dc.type.dcmitypeTexten_US


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