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dc.contributorVirginia Techen_US
dc.contributor.authorPriya, Shashanken_US
dc.contributor.authorKim, Hyeoung Wooen_US
dc.contributor.authorRyu, Junghoen_US
dc.contributor.authorUchino, Kenjien_US
dc.contributor.authorViehland, Dwight D.en_US
dc.date.accessioned2014-02-03T15:57:16Z
dc.date.available2014-02-03T15:57:16Z
dc.date.issued2002-03-01
dc.identifier.citationPriya, S; Kim, HW; Ryu, J; et al., "Fractal cluster modeling of the fatigue behavior of lead zirconate titanate," Appl. Phys. Lett. 80, 1625 (2002); http://dx.doi.org/10.1063/1.1455699
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/10919/25257
dc.description.abstractThe fatigue behavior of lead zirconate titanate ceramics (PZT) has been studied under electrical and mechanical drives. Piezoelectric fatigue was studied using a mechanical method. Under ac mechanical drive, hard and soft PZTs showed an increase in the longitudinal piezoelectric constant at short times, reaching a maximum at intermediate times. Systematic investigations were performed to characterize the electrical fatigue behavior. A decrease in the magnitude of the remanent polarization was observed, which was relatively high for soft PZT. The dynamics of fatigue have been shown to scale to a hierarchical relaxation process, and this is typical of random field systems. (C) 2002 American Institute of Physics.
dc.format.mimetypeapplication/pdfen_US
dc.language.isoen_US
dc.publisherAIP Publishing
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectPolarization reversalen_US
dc.subjectSingle crystalsen_US
dc.subjectThin filmsen_US
dc.subjectRelaxersen_US
dc.subjectFerroelectricsen_US
dc.subjectSuppressionen_US
dc.subjectElectrodesen_US
dc.subjectCapacitorsen_US
dc.subjectMechanismsen_US
dc.subjectPhysicsen_US
dc.titleFractal cluster modeling of the fatigue behavior of lead zirconate titanateen_US
dc.typeArticle - Refereeden_US
dc.contributor.departmentMaterials Science and Engineering (MSE)en_US
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/apl/80/9/10.1063/1.1455699
dc.date.accessed2014-01-24
dc.title.serialApplied Physics Letters
dc.identifier.doihttps://doi.org/10.1063/1.1455699
dc.type.dcmitypeTexten_US


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