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dc.contributorVirginia Techen
dc.contributor.authorUllrich, B.en
dc.contributor.authorSchroeder, R.en
dc.contributor.authorGraupner, W.en
dc.contributor.authorSakai, H.en
dc.date.accessioned2014-03-14T15:08:16Zen
dc.date.available2014-03-14T15:08:16Zen
dc.date.issued2001-07en
dc.identifier.citationBruno Ullrich, Raoul Schroeder, Willi Graupner, and S. Sakai, "The influence of self-absorption on the photoluminescence of thin film CdS demonstrated by two-photon absorption," Opt. Express 9, 116-120 (2001); doi: 10.1364/OE.9.000116en
dc.identifier.issn1094-4087en
dc.identifier.urihttp://hdl.handle.net/10919/25931en
dc.description.abstractBy means of two-photon excited photoluminescence, we demonstrate the influence of self-absorption on the emission properties of thin (1.5 mum) film CdS formed by laser ablation. The excitation of the sample is performed with 200 fs pulses at 804 nm (1.54 eV). The photoluminescence spectrum takes the form of a single peak centered at 510 nm (2.43 eV) at 300 K. The spectrum is shifted about 45 meV to lower energies with respect to the photoluminescence excited by one photon absorption. By fitting the photoluminescence spectra with the Roosbroeck-Shockley relation and Urbach's rule, it is shown by Beer's law that the shift is caused by self-absorption. The results further provide evidence of low impurity concentration and excellent surface quality. They also confirm the outstanding optical properties of thin film CdS formed by pulsed-laser deposition and suggest the application of the films for effective up-conversation materials in ultra-fast experiments. (C) 2001 Optical Society of America.en
dc.language.isoen_USen
dc.publisherOptical Society of Americaen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectroom-temperatureen
dc.titleThe influence of self-absorption on the photoluminescence of thin film CdS demonstrated by two-photon absorptionen
dc.typeArticle - Refereeden
dc.contributor.departmentPhysicsen
dc.identifier.urlhttp://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-9-3-116en
dc.date.accessed2014-02-06en
dc.title.serialOptics Expressen
dc.identifier.doihttps://doi.org/10.1364/OE.9.000116en


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