Virginia Tech
    • Log in
    View Item 
    •   VTechWorks Home
    • ETDs: Virginia Tech Electronic Theses and Dissertations
    • Doctoral Dissertations
    • View Item
    •   VTechWorks Home
    • ETDs: Virginia Tech Electronic Theses and Dissertations
    • Doctoral Dissertations
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Modeling nonlinear material behavior at the nano and macro scales

    Thumbnail
    View/Open
    ETD.pdf (5.024Mb)
    Downloads: 433
    Movie_5.mov (4.999Mb)
    Downloads: 103
    Movie_2.mov (23.88Mb)
    Downloads: 115
    Movie_1.mov (4.399Mb)
    Downloads: 80
    Movie_3.mov (35.05Mb)
    Downloads: 101
    Movie_4.mov (2.382Mb)
    Downloads: 82
    Date
    2008-05-12
    Author
    Nair, Arun Krishnan
    Metadata
    Show full item record
    Abstract
    Theoretical and computational methods have been used to study nonlinear effects in the mechanical response of materials at the nano and macro scales. These methods include, acoustoelastic theory, molecular dynamics and finite element models. The nonlinear indentation response of Ni thin films of thicknesses in the nano scale was studied using molecular dynamics simulations with embedded atom method (EAM) interatomic potentials. The study included both single crystal films and films containing low angle grain boundaries perpendicular to the film surface. The simulation results for single crystal films show that as film thickness decreases, larger forces are required for similar indentation depths but the contact stress necessary to emit the first dislocation under the indenter is nearly independent of film thickness. The presence of grain boundaries in the films leads to the emission of dislocations at a lower applied stress. For a single crystal Ni thin film of a thickness of 20 nm a direct comparison of simulation and experimental results is presented, showing excellent agreement in hardness values. The effects of using different interatomic potentials and indentation rates for the simulations are also discussed. Dynamic indentation of the Ni thin film was also carried out for different frequencies. It has been found that there is a 12% increase in dislocations compared to quasi static indentation and the results are consistent with experiments. Acoustoelastic theory was used to study how nonlinear elastic properties of unidirectional graphite/epoxy (gr/ep) effect the energy flux deviation due to an applied shear stress. It was found that the quasi-transverse wave (QT) exhibits more flux deviation compared to the quasi-longitudinal (QL) or the pure transverse (PT) due to an applied shear stress. The flux shift in QT wave due to an applied shear stress is higher than that for an applied normal stress along laminate stacking direction for the same magnitude. The QT wave has energy flux deviation due to shear stress at 0o and 90o fiber orientations as compared to normal stress case where the flux deviation is zero. It was found that the energy flux shift of QT wave in gr/ep varies linearly with applied shear stress. The Finite element model of the equations of motion combined with the Newmark method in time was used to confirm the flux shift predicted by theory.
    URI
    http://hdl.handle.net/10919/28432
    Collections
    • Doctoral Dissertations [16444]

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us
     

     

    VTechWorks

    AboutPoliciesHelp

    Browse

    All of VTechWorksCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    Log inRegister

    Statistics

    View Usage Statistics

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us