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dc.contributor.authorBurrows, Steven Prestonen_US
dc.date.accessioned2014-03-14T20:32:09Z
dc.date.available2014-03-14T20:32:09Z
dc.date.issued2010-02-10en_US
dc.identifier.otheretd-02242010-030144en_US
dc.identifier.urihttp://hdl.handle.net/10919/31342
dc.description.abstractWithin the â forbiddenâ range of electron energies between the valence and conduction bands of titanium dioxide, crystal lattice irregularities lead to the formation of electron trapping sites. These sites are known as shallow trap states, where â shallowâ refers to the close energy proximity of those features to the bottom of the semiconductor conduction band. For wide bandgap semiconductors like titanium dioxide, shallow electron traps are the principle route for thermal excitation of electrons into the conduction band.

The studies described here employ a novel infrared spectroscopic approach to determine the energy of shallow electron traps in titanium dioxide nanoparticles. Mobile electrons within the conduction band of semiconductors are known to absorb infrared radiation. As those electrons absorb the infrared photons, transitions within the continuum of the conduction band produce a broad spectral signal across the entire mid-infrared range. A Mathematical expression based upon Fermiâ Dirac statistics was derived to correlate the temperature of the particles to the population of charge carriers, as measured through the infrared absorbance. The primary variable of interest in the Fermi â Dirac expression is the energy difference between the shallow trap states and the conduction band. Fitting data sets consisting of titanium dioxide nanoparticle temperatures and their associated infrared spectra, over a defined frequency range, to the Fermiâ Dirac expression is used to determine the shallow electron trap state energy.

en_US
dc.publisherVirginia Techen_US
dc.relation.haspartBurrows_SP_T_2010.pdfen_US
dc.rightsI hereby certify that, if appropriate, I have obtained and attached hereto a written permission statement from the owner(s) of each third party copyrighted matter to be included in my thesis, dissertation, or project report, allowing distribution as specified below. I certify that the version I submitted is the same as that approved by my advisory committee. I hereby grant to Virginia Tech or its agents the non-exclusive license to archive and make accessible, under the conditions specified below, my thesis, dissertation, or project report in whole or in part in all forms of media, now or hereafter known. I retain all other ownership rights to the copyright of the thesis, dissertation or project report. I also retain the right to use in future works (such as articles or books) all or part of this thesis, dissertation, or project report.en_US
dc.subjectnanoparticlesen_US
dc.subjectsemiconductoren_US
dc.subjectsurface stateen_US
dc.subjectshallow trap stateen_US
dc.subjectinfrared spectroscopyen_US
dc.subjectcatalysisen_US
dc.subjectconduction band electronsen_US
dc.subjecttitanium dioxideen_US
dc.titleInfrared Spectroscopic Measurement of Titanium Dioxide Nanoparticle Shallow Trap State Energiesen_US
dc.typeThesisen_US
dc.contributor.departmentChemistryen_US
dc.description.degreeMaster of Scienceen_US
thesis.degree.nameMaster of Scienceen_US
thesis.degree.levelmastersen_US
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen_US
thesis.degree.disciplineChemistryen_US
dc.contributor.committeechairMorris, John R.en_US
dc.contributor.committeememberBrewer, Karen J.en_US
dc.contributor.committeememberLong, Gary L.en_US
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-02242010-030144/en_US
dc.date.sdate2010-02-24en_US
dc.date.rdate2010-03-19
dc.date.adate2010-03-19en_US


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