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dc.contributor.authorSewall, Lyle Matthewen_US
dc.date.accessioned2014-03-14T20:45:19Z
dc.date.available2014-03-14T20:45:19Z
dc.date.issued2006-08-23en_US
dc.identifier.otheretd-09122006-150639en_US
dc.identifier.urihttp://hdl.handle.net/10919/35031
dc.description.abstractA new approach is presented that relies upon 3D electromagnetic simulation results to characterize the complex permittivity of homogeneous dielectric materials. By modeling the test fixture and obtaining a set of simulated S-parameters through an iterative solution process, the dielectric constant and loss tangent can be found. With further development, the 3D simulation results may be used to replace the need for complex theoretical analysis of the measurement geometry. The method is applied to an X-band rectangular waveguide setup, for which the theoretical S-parameters can be readily calculated. A Teflon sample, for which the dielectric properties are well-known, is used for all measurements and calculations. After presenting a detailed derivation to obtain the theoretical S-parameters, the Teflon sample is measured and compared to the theoretical results, from which the comparison shows great promise. An inverse solution algorithm is used to solve for the material properties from the experimental S-parameters. Low-frequency measurement of the Teflon sheet was performed by using a dielectric capacitor test fixture. The results show the effect of an air gap between the electrode and sample, producing serious errors.en_US
dc.publisherVirginia Techen_US
dc.relation.haspartSewall-Final_Thesis.pdfen_US
dc.rightsI hereby certify that, if appropriate, I have obtained and attached hereto a written permission statement from the owner(s) of each third party copyrighted matter to be included in my thesis, dissertation, or project report, allowing distribution as specified below. I certify that the version I submitted is the same as that approved by my advisory committee. I hereby grant to Virginia Tech or its agents the non-exclusive license to archive and make accessible, under the conditions specified below, my thesis, dissertation, or project report in whole or in part in all forms of media, now or hereafter known. I retain all other ownership rights to the copyright of the thesis, dissertation or project report. I also retain the right to use in future works (such as articles or books) all or part of this thesis, dissertation, or project report.en_US
dc.subjectCapacitoren_US
dc.subjectMaterialen_US
dc.subjectDielectricen_US
dc.subjectWaveguideen_US
dc.subjectCharacterizationen_US
dc.subjectElectromagnetic Simulationen_US
dc.subjectSystematic Erroren_US
dc.subjectSimulatoren_US
dc.titleDielectric Characterization: A 3D EM Simulation Approachen_US
dc.typeThesisen_US
dc.contributor.departmentElectrical and Computer Engineeringen_US
dc.description.degreeMaster of Scienceen_US
thesis.degree.nameMaster of Scienceen_US
thesis.degree.levelmastersen_US
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen_US
thesis.degree.disciplineElectrical and Computer Engineeringen_US
dc.contributor.committeechairRiad, Sedki Mohameden_US
dc.contributor.committeememberDavis, William A.en_US
dc.contributor.committeememberSafaai-Jazi, Ahmaden_US
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-09122006-150639/en_US
dc.date.sdate2006-09-12en_US
dc.date.rdate2006-12-18
dc.date.adate2006-12-18en_US


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