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dc.contributor.authorCropper, André D.en_US
dc.date.accessioned2014-03-14T21:13:07Z
dc.date.available2014-03-14T21:13:07Z
dc.date.issued1995-04-07en_US
dc.identifier.otheretd-06062008-162117en_US
dc.identifier.urihttp://hdl.handle.net/10919/38163
dc.description.abstractsee documenten_US
dc.format.mediumBTDen_US
dc.publisherVirginia Techen_US
dc.relation.haspartLD5655.V856_1995.C767.pdfen_US
dc.subjectcarrier lifetimeen_US
dc.subjectdiffusion lengthen_US
dc.subjectelectron beam induced currenten_US
dc.subject.lccLD5655.V856 1995.C767en_US
dc.titleCarrier transport properties measurements in wide bandgap materialsen_US
dc.typeDissertationen_US
dc.contributor.departmentElectrical Engineeringen_US
dc.description.degreePh. D.en_US
thesis.degree.namePh. D.en_US
thesis.degree.leveldoctoralen_US
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen_US
thesis.degree.disciplineElectrical Engineeringen_US
dc.contributor.committeechairMoore, Daniel J.en_US
dc.contributor.committeechairLu, Guo-Quanen_US
dc.contributor.committeememberElshabini-Riad, Aicha A.en_US
dc.contributor.committeememberScott, Craig J.en_US
dc.contributor.committeememberAning, Alexander O.en_US
dc.contributor.committeememberWhite, Carlen_US
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-06062008-162117/en_US
dc.date.sdate2008-06-06en_US
dc.date.rdate2008-06-06
dc.date.adate2008-06-06en_US


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