Virginia Tech
    • Log in
    View Item 
    •   VTechWorks Home
    • Student Works
    • Master's Papers and Projects
    • View Item
    •   VTechWorks Home
    • Student Works
    • Master's Papers and Projects
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Manufacturing system maintenance development

    Thumbnail
    View/Open
    LD5655.V851_1996.B694.pdf (4.884Mb)
    Downloads: 29
    Date
    1996-12-06
    Author
    Bowen, Brennan P.
    Metadata
    Show full item record
    Abstract
    In this report, the Process Failure Modes and Effects Analysis (PFMEA) and the Reliability-Centered Maintenance (RCM) analysis are used in tandem to initialize a cost-effective maintenance plan for the Amada HFA-330 band saw. The intent of this report is to describe and demonstrate how the two analyses are used to develop the maintenance plan. As part of the maintenance plan development, consideration is given to the effects of processor down time on the throughput and profitability of the manufacturing system. Any processor failure that decreases throughput of the manufacturing system will create a loss in opportunity to fulfill demand. After determining a maintenance plan, data should be collected from the system to reaffirm or revise the maintenance decision. Data collected from the manufacturing system may provide move accurate estimates allowing the analyst to reiterate the procedures and improve the plan. This methodology would be useful in the design phase to assess the lifecycle cost of a system design. This methodology can be used to estimate the cost of maintenance. The life-cycle cost of the system can then be estimated from estimates of research and development, construction, start-up, operation and maintenance, and system disposal estimates. Given multiple alternatives, a decision on the preferred system can be made based on life-cycle costs.
    URI
    http://hdl.handle.net/10919/40805
    Collections
    • Master's Papers and Projects [604]

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us
     

     

    VTechWorks

    AboutPoliciesHelp

    Browse

    All of VTechWorksCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    Log inRegister

    Statistics

    View Usage Statistics

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us