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dc.contributor.authorThomas, Daniel D.en_US
dc.date.accessioned2014-03-14T21:32:11Z
dc.date.available2014-03-14T21:32:11Z
dc.date.issued1990en_US
dc.identifier.otheretd-03242009-040449en_US
dc.identifier.urihttp://hdl.handle.net/10919/41752
dc.format.mediumBTDen_US
dc.publisherVirginia Techen_US
dc.relation.haspartLD5655.V855_1990.T564.pdfen_US
dc.subjectStrains and stresses.en_US
dc.subject.lccLD5655.V855 1990.T564en_US
dc.titleHigh resolution optical time domain methods for measuring strainen_US
dc.typeThesisen_US
dc.contributor.departmentElectrical Engineeringen_US
dc.description.degreeMaster of Scienceen_US
thesis.degree.nameMaster of Scienceen_US
thesis.degree.levelmastersen_US
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen_US
thesis.degree.disciplineElectrical Engineeringen_US
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-03242009-040449/en_US
dc.date.sdate2009-03-24en_US
dc.date.rdate2009-03-24
dc.date.adate2009-03-24en_US


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