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dc.contributor.authorLam, Fong-Sheken_US
dc.date.accessioned2014-03-14T21:41:09Z
dc.date.available2014-03-14T21:41:09Z
dc.date.issued1989-09-15en_US
dc.identifier.otheretd-07242012-040138en_US
dc.identifier.urihttp://hdl.handle.net/10919/43900
dc.description.abstract

In this thesis, new methods to handle reconvergent fanout and feed-back during behavioral level test generation are proposed. These methods have been implemented - into a previously developed automatic test generator. The improved test generator was tested on five behavioral circuit models. For circuits with the reconvergent fanout situation, the improved test generator can generate tests completely automatically. For circuits with feed-back, user assistance in a circuit initialization step is required. Some suggestions for future development for the test generator are discussed. Examples on how to use the improved test generator are presented.

en_US
dc.format.mediumBTDen_US
dc.publisherVirginia Techen_US
dc.relation.haspartLD5655.V855_1989.L35.pdfen_US
dc.subjectIntegrated circuitsen_US
dc.subject.lccLD5655.V855 1989.L35en_US
dc.titleTest generation for behavioral models with reconvergent fanout and feed-backen_US
dc.typeThesisen_US
dc.contributor.departmentElectrical Engineeringen_US
dc.description.degreeMaster of Scienceen_US
thesis.degree.nameMaster of Scienceen_US
thesis.degree.levelmastersen_US
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen_US
thesis.degree.disciplineElectrical Engineeringen_US
dc.contributor.committeechairArmstrong, James R.en_US
dc.contributor.committeememberMidkiff, Scott F.en_US
dc.contributor.committeememberTront, Joseph G.en_US
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-07242012-040138/en_US
dc.date.sdate2012-07-24en_US
dc.date.rdate2012-07-24
dc.date.adate2012-07-24en_US


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