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dc.contributor.authorBecker, Brian Alanen_US
dc.date.accessioned2014-03-14T21:49:23Z
dc.date.available2014-03-14T21:49:23Z
dc.date.issued1993-01-18en_US
dc.identifier.otheretd-11102009-020108en_US
dc.identifier.urihttp://hdl.handle.net/10919/45599
dc.description.abstractMicroprocessors are used in many applications where a high degree of reliability is required. For instance, satellite based systems operating in space have no way being serviced if something were goes wrong. Often these systems, operating in radiation environments, are subject to random high energy particles that pass through the device and upset the operation of the microprocessor for a short period but leave no permanent damage. These transient faults are difficult to predict, prevent, or detect but can lead to a system failure if not discovered.en_US
dc.format.mediumBTDen_US
dc.publisherVirginia Techen_US
dc.relation.haspartLD5655.V855_1993.B435.pdfen_US
dc.subjectElectric fault location.en_US
dc.subject.lccLD5655.V855 1993.B435en_US
dc.titleTransient fault detection using a watchdog processoren_US
dc.typeThesisen_US
dc.contributor.departmentElectrical Engineeringen_US
dc.description.degreeMaster of Scienceen_US
thesis.degree.nameMaster of Scienceen_US
thesis.degree.levelmastersen_US
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen_US
thesis.degree.disciplineElectrical Engineeringen_US
dc.contributor.committeechairTront, Joseph G.en_US
dc.contributor.committeememberArmstrong, James R.en_US
dc.contributor.committeememberHa, Dong Samen_US
dc.identifier.sourceurlhttp://scholar.lib.vt.edu/theses/available/etd-11102009-020108/en_US
dc.date.sdate2009-11-10en_US
dc.date.rdate2009-11-10
dc.date.adate2009-11-10en_US


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