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dc.contributorVirginia Techen_US
dc.contributor.authorZhu, Y. Z.en_US
dc.contributor.authorWang, Anboen_US
dc.date.accessioned2014-04-04T15:12:28Z
dc.date.available2014-04-04T15:12:28Z
dc.date.issued2006-02-01
dc.identifier.citationYizheng Zhu and Anbo Wang, "Surface-mount sapphire interferometric temperature sensor," Appl. Opt. 45, 6071-6076 (2006). doi: 10.1364/AO.45.006071
dc.identifier.issn1559-128X
dc.identifier.urihttp://hdl.handle.net/10919/46967
dc.description.abstractA fiber-optic high-temperature sensor is demonstrated by bonding a 45 degrees-polished single-crystal sapphire fiber on the surface of a sapphire wafer, whose optical thickness is temperature dependent and measured by white-light interferometry. A novel adhesive-free coupling between the silica and sapphire fibers is achieved by fusion splicing, and its performance is characterized. The sensor's interference signal is investigated for its dependence on angular alignment between the fiber and the wafer. A prototype sensor is tested to 1170 degrees C with a resolution of 0.4 degrees C, demonstrating excellent potential for high-temperature measurement. (C) 2006 Optical. Society of America.
dc.description.sponsorshipU.S. Department of Energy DE-FC26-99FT40685
dc.format.mimetypeapplication/pdfen_US
dc.language.isoen_US
dc.publisherOptical Society of America
dc.subjectOptical-fiber thermometeren_US
dc.titleSurface-Mount Sapphire Interferometric Temperature Sensoren_US
dc.typeArticle - Refereeden_US
dc.identifier.urlhttp://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-45-24-6071
dc.date.accessed2014-02-24
dc.title.serialApplied Optics
dc.identifier.doihttps://doi.org/10.1364/AO.45.006071
dc.type.dcmitypeTexten_US


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