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dc.contributorVirginia Techen_US
dc.contributor.authorKwok, C. K.en_US
dc.contributor.authorDesu, Seshu B.en_US
dc.date.accessioned2014-04-09T18:12:24Z
dc.date.available2014-04-09T18:12:24Z
dc.date.issued1993-09-01
dc.identifier.citationKwok, C. K.; Desu, S. B., "novel method for determining the Curie-temperature of ferroelectric-films," Rev. Sci. Instrum. 64, 2604 (1993); http://dx.doi.org/10.1063/1.1143876
dc.identifier.issn0034-6748
dc.identifier.urihttp://hdl.handle.net/10919/47067
dc.description.abstractA novel technique to measure the Curie temperature of ferroelectric thin films has been developed. The method is based on identifying changes in slope of film stress versus temperature plot. At the Curie temperature, ferroelectric films undergo a phase transition from ferroelectric phase to paraelectric phase. Due to this phase transformation, physical properties of films such as elastic constants and coefficients of thermal expansion also change at the Curie temperature. Consequently, at this temperature the temperature coefficient of film stress changes since it is related to elastic constants and thermal expansion coefficient. Thus, by measuring the film stress as a function of temperature, the Curie temperature can be determined. The Curie temperatures measured by this method are in good agreement with the literature values. Small discrepancies that were observed can be attributed to the intrinsic stresses present in the films.
dc.format.mimetypeapplication/pdfen_US
dc.language.isoen_US
dc.publisherAIP Publishing
dc.subjectCurie pointen_US
dc.subjectFerroelectric thin filmsen_US
dc.subjectFerroelectric phase transitionsen_US
dc.subjectElasticityen_US
dc.subjectPhase transitionsen_US
dc.subjectTemperature measurementen_US
dc.subjectThermal expansionen_US
dc.subjectThermal propertiesen_US
dc.subjectThermodynamic propertiesen_US
dc.titleNovel Method For Determining The Curie-Temperature Of Ferroelectric-Filmsen_US
dc.typeArticle - Refereeden_US
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/rsi/64/9/10.1063/1.1143876
dc.date.accessed2014-03-20
dc.title.serialReview of Scientific Instruments
dc.identifier.doihttps://doi.org/10.1063/1.1143876
dc.type.dcmitypeTexten_US


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