Virginia Tech
    • Log in
    View Item 
    •   VTechWorks Home
    • College of Engineering (COE)
    • Bradley Department of Electrical and Computer Engineering
    • Scholarly Works, Electrical and Computer Engineering
    • View Item
    •   VTechWorks Home
    • College of Engineering (COE)
    • Bradley Department of Electrical and Computer Engineering
    • Scholarly Works, Electrical and Computer Engineering
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    On the evanescent fields and the causality of the focus wave modes

    Thumbnail
    View/Open
    Main article (1.902Mb)
    Downloads: 363
    Date
    1995-08-01
    Author
    Shaarawi, Amr M.
    Ziolkowski, R. W.
    Besieris, Ioannis M.
    Metadata
    Show full item record
    Abstract
    The diverging and converging field components of the source-free focus wave modes are studied within the framework of both the Whittaker and Weyl plane wave expansions, It is shown that, in the Weyl picture, the evanescent fields associated with the diverging and converging components of the focus wave mode solution cancel each other identically, The source-free focus wave modes are, hence, composed solely of backward and forward propagating components of the Whittaker type, It will also be shown that no evanescent fields are associated with the causal excitation of an aperture by an initial focus wave mode field. The diverging field, however, is composed solely of causal components that propagate away from the aperture. With a specific choice of parameters, the field generated by the aperture is a very good approximation to the source-free solution. Under the same conditions, the original focus wave mode solution is composed predominantly of causal forward propagating fields. (C) 1995 American Institute of Physics.
    URI
    http://hdl.handle.net/10919/47070
    Collections
    • Scholarly Works, Electrical and Computer Engineering [531]

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us
     

     

    VTechWorks

    AboutPoliciesHelp

    Browse

    All of VTechWorksCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    Log inRegister

    Statistics

    View Usage Statistics

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us