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dc.contributorVirginia Techen_US
dc.contributor.authorYao, Jianjunen_US
dc.contributor.authorLi, Jiefangen_US
dc.contributor.authorViehland, Dwight D.en_US
dc.contributor.authorChang, Y. F.en_US
dc.contributor.authorMessing, G. L.en_US
dc.date.accessioned2014-04-16T14:16:38Z
dc.date.available2014-04-16T14:16:38Z
dc.date.issued2012-03-01
dc.identifier.citationYao, Jianjun; Li, Jiefang; Viehland, D.; et al., "Aging associated domain evolution in the orthorhombic phase of < 001 > textured (K0.5Na0.5)Nb0.97Sb0.03O3 ceramics," Appl. Phys. Lett. 100, 132902 (2012); http://dx.doi.org/10.1063/1.3698154
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/10919/47365
dc.description.abstractAging effect due to domain evolution in (K-0.5,Na-0.5)Nb0.97Sb0.03O3 < 001 > textured ceramics was investigated by piezoresponse force microscopy. We find that aging effect is pronounced in the orthorhombic single phase field. A more uniform and finer domain structure on the order of several hundred nanometers was observed after aging and is believed to originate from defect-migration. After poling, large domains (similar to 10 mu m) with smooth boundaries were found in the aged condition due to the more readily redistribution of uniform and finer domain structures after aging. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3698154]
dc.description.sponsorshipNational Science Foundation (Materials World Network) DMR-0806592
dc.description.sponsorshipDepartment of Energy under DE-FG02-07ER46480
dc.description.sponsorshipChina Scholarship Council
dc.format.mimetypeapplication/pdfen_US
dc.language.isoen_US
dc.publisherAIP Publishing
dc.subjectFerroelectric single-crystalsen_US
dc.subjectEnhanced piezoelectricityen_US
dc.subjectPerovskitesen_US
dc.subjectBehavioren_US
dc.subjectStrainen_US
dc.titleAging associated domain evolution in the orthorhombic phase of < 001 > textured (K0.5Na0.5)Nb0.97Sb0.03O3 ceramicsen_US
dc.typeArticleen_US
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/apl/100/13/10.1063/1.3698154
dc.date.accessed2014-03-27
dc.title.serialApplied Physics Letters
dc.identifier.doihttps://doi.org/10.1063/1.3698154
dc.type.dcmitypeTexten_US


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