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dc.contributorVirginia Techen_US
dc.contributor.authorWu, Y. C.en_US
dc.contributor.authorSuris, R. A.en_US
dc.contributor.authorAsryan, Levon V.en_US
dc.date.accessioned2014-04-16T14:16:41Z
dc.date.available2014-04-16T14:16:41Z
dc.date.issued2013-05-01
dc.identifier.citationWu, Yuchang; Suris, Robert A.; Asryan, Levon V., "Effect of excited states on the ground-state modulation bandwidth in quantum dot lasers," Appl. Phys. Lett. 102, 191102 (2013); http://dx.doi.org/10.1063/1.4804994
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/10919/47376
dc.description.abstractWe consider direct and indirect (excited-state-mediated) capture of carriers from the waveguide region into the lasing ground state in quantum dots (QDs) and calculate the modulation response of a QD laser. We show that, when only indirect capture is involved, the excited-to-ground-state relaxation delay strongly limits the ground-state modulation bandwidth of the laser-at the longest tolerable relaxation time, the bandwidth becomes zero. When direct capture is also involved, the effect of excited-to-ground-state relaxation is less significant and the modulation bandwidth is considerably higher. (C) 2013 AIP Publishing LLC.
dc.description.sponsorshipU.S. Army Research Office (Grant No. W911-NF-08-1-0462)
dc.description.sponsorshipChina Scholarship Council
dc.description.sponsorshipRussian Foundation for Basic Research (Grant No. 11-02-00573)
dc.description.sponsorshipProgram "Fundamental Research in Nanotechnology and Nanomaterials" of the Presidium of the Russian Academy of Sciences
dc.format.mimetypeapplication/pdfen_US
dc.language.isoen_US
dc.publisherAIP Publishing
dc.subjectCarrier relaxation dynamicsen_US
dc.subjectMaximum modal gainen_US
dc.subjectCaptureen_US
dc.subjectSaturationen_US
dc.subjectThresholden_US
dc.titleEffect of excited states on the ground-state modulation bandwidth in quantum dot lasersen_US
dc.typeArticle - Refereeden_US
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/apl/102/19/10.1063/1.4804994
dc.date.accessed2014-03-27
dc.title.serialApplied Physics Letters
dc.identifier.doihttps://doi.org/10.1063/1.4804994
dc.type.dcmitypeTexten_US


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