Virginia Tech
    • Log in
    View Item 
    •   VTechWorks Home
    • College of Engineering (COE)
    • Department of Materials Science and Engineering (MSE)
    • Faculty Works, Materials Science and Engineering (MSE)
    • View Item
    •   VTechWorks Home
    • College of Engineering (COE)
    • Department of Materials Science and Engineering (MSE)
    • Faculty Works, Materials Science and Engineering (MSE)
    • View Item
    JavaScript is disabled for your browser. Some features of this site may not work without it.

    Oriented growth of SrBi2Ta2O9 ferroelectric thin films

    Thumbnail
    View/Open
    Main article (265.6Kb)
    Downloads: 296
    Date
    1996-09-01
    Author
    Desu, Seshu B.
    Vijay, D. P.
    Zhang, X.
    He, B. P.
    Metadata
    Show full item record
    Abstract
    We report on the ferroelectric properties of c-axis oriented ferroelectric SrBi2Ta2O9 thin films. Pt/SrBi2Ta2O9/Pt capacitors were grown on single crystal MgO (and/or SrTiO3) substrates using pulsed laser ablation. These substrates provide the necessary template for (100) texture in platinum due to their close lattice matching. This in turn facilitates the c-axis orientation in the ferroelectric films. The degree of orientation in the layered structure ferroelectric film was systematically varied from highly c-axis oriented to random polycrystalline by varying the growth conditions of the bottom metal electrode. The polarization and coercive field values were found to decrease with an increasing degree of c-axis orientation; while the randomly oriented films exhibited a remnant polarization of 5 mu C/cm(2), a coercive field of 70 kV/cm, and a dielectric constant of 320, the c-axis oriented films exhibited very low polarization (similar to 1 mu C/cm(2)), coercivity (22 kV/cm), and dielectric constant (similar to 200) values. (C) 1996 American Institute of Physics.
    URI
    http://hdl.handle.net/10919/47399
    Collections
    • Faculty Works, Materials Science and Engineering (MSE) [362]

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us
     

     

    VTechWorks

    AboutPoliciesHelp

    Browse

    All of VTechWorksCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

    My Account

    Log inRegister

    Statistics

    View Usage Statistics

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

    Virginia Tech | University Libraries | Contact Us