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dc.contributorVirginia Tech
dc.contributor.authorMonsegue, N.
dc.contributor.authorJin, X.
dc.contributor.authorEchigo, T.
dc.contributor.authorWang, G.
dc.contributor.authorMurayama, M.
dc.date.accessioned2014-07-21T15:49:40Z
dc.date.available2014-07-21T15:49:40Z
dc.date.issued2012-12
dc.identifier.citationMonsegue, N.; Jin, X.; Echigo, T.; Wang, G.; Murayama, M., "Three-Dimensional Characterization of Iron Oxide (alpha-Fe2O3) Nanoparticles: Application of a Compressed Sensing Inspired Reconstruction Algorithm to Electron Tomography," Microsc. Microanal. 18, 1362-1367, 2012. DOI: 10.1017/s1431927612013530
dc.identifier.issn1431-9276
dc.identifier.urihttp://hdl.handle.net/10919/49644
dc.description.abstractIn this article, we demonstrate the application of a new compressed sensing three-dimensional reconstruction algorithm for electron tomography that increases the accuracy of morphological characterization of nanostructured materials such as nanocrystalline iron oxide particles. A powerful feature of the algorithm is an anisotropic total variation norm for the L1 minimization during algebraic reconstruction that effectively reduces the elongation artifacts caused by limited angle sampling during electron tomography. The algorithm provides faithful morphologies that have not been feasible with existing techniques.
dc.description.sponsorshipU.S. Department of Energy Grant DE-FG02-06ER15786
dc.description.sponsorshipJapan Society for the Promotion of Science, Research Fellowships for Young Scientists (PD20-1531)
dc.description.sponsorshipJapan Excellent Young Researcher Overseas Visit Program
dc.language.isoen_US
dc.publisherCambridge University Press
dc.subjectcomputed tomography
dc.subjectstem
dc.subjectcompressed sensing
dc.subject3d reconstruction
dc.subjectquantification
dc.subjecthematite
dc.subjectmaterials science, multidisciplinary
dc.subjectmicroscopy
dc.titleThree-Dimensional Characterization of Iron Oxide (alpha-Fe2O3) Nanoparticles: Application of a Compressed Sensing Inspired Reconstruction Algorithm to Electron Tomography
dc.typeArticle - Refereed
dc.identifier.urlhttp://journals.cambridge.org/action/displayFulltext?type=1&fid=8788485&jid=MAM&volumeId=18&issueId=06&aid=8788483&bodyId=&membershipNumber=&societyETOCSession=
dc.date.accessed2014-07-15
dc.title.serialMicroscopy and Microanalysis
dc.identifier.doihttps://doi.org/10.1017/s1431927612013530


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