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    Nonlinear vibrations of microcantilevers subjected to tip-sample interactions: Theory and experiment 

    Delnavaz, Aidin; Mahmoodi, S. Nima; Jalili, Nader; Ahmadian, Mehdi; Zohoor, Hassan (American Institute of Physics, 2009-12-01)
    Improvement of microcantilever-based sensors and actuators chiefly depends on their modeling accuracy. Atomic force microscopy (AFM) is the most widespread application of microcantilever beam as a sensor, which is usually ...

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    Content TypeArticle - Refereed (1)Subject
    Antiferromagnetism (1)
    Atomic force microscopy (1)
    Lagrangian mechanics (1)
    Structural beam vibrations (1)
    Vibration resonance (1)
    ... View MoreDate Issued2009 (1)AuthorAhmadian, Mehdi (1)Delnavaz, Aidin (1)Jalili, Nader (1)Mahmoodi, S. Nima (1)
    Zohoor, Hassan (1)
    Has File(s)Yes (1)

    If you believe that any material in VTechWorks should be removed, please see our policy and procedure for Requesting that Material be Amended or Removed. All takedown requests will be promptly acknowledged and investigated.

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