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dc.contributorVirginia Tech. Department of Materials Engineeringen_US
dc.contributorNaval Research Laboratory (U.S.)en_US
dc.contributorOak Ridge National Laboratoryen_US
dc.contributor.authorRao, Satish I.en_US
dc.contributor.authorHouska, Charles R.en_US
dc.contributor.authorGrabowski, Kennethen_US
dc.contributor.authorIce, Gene E.en_US
dc.contributor.authorSparks, C. J.en_US
dc.date.accessioned2015-05-21T19:47:21Z
dc.date.available2015-05-21T19:47:21Z
dc.date.issued1991-06-15
dc.identifier.citationRao, S. I., Houska, C. R., Grabowski, K., Ice, G., Sparks, C. J. (1991). X‐ray diffuse scattering from a nitrogen‐implanted niobium film. Journal of Applied Physics, 69(12), 8104-8110. doi: 10.1063/1.347460en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/10919/52410
dc.description.abstractA 2500-angstrom niobium single-crystal film was deposited onto a sapphire substrate and subsequently implanted with nitrogen to an average concentration of 0.5 at. %. Synchrotron radiation was used to measure the difference between the implanted and an unimplanted film to isolate the diffuse scattering from the implanted film near two Bragg reflections. This diffuse intensity arises mainly from elastic displacement fields about radiation-damage-related loops located on (211) planes. A small contribution of the scattering is calculated from the displacements about single interstitial nitrogen in octahedral sites. The Burgers vector of the loops is along the [111BAR] direction and makes an angle of 62-degrees with the loop plane giving a dominant shear component. Vacancy loops have a radius approximately 5 angstrom while interstitials are somewhat larger ranging from 10 to 15 angstrom. The number of vacancies and interstitials are nearly the same.en_US
dc.description.sponsorshipUnited States. Office of Naval Research - Grant No. N00014-83-K-0750, P0004en_US
dc.description.sponsorshipUnited States. Department of Energy. Division of Materials Sciences and Division of Chemical Sciencesen_US
dc.description.sponsorshipMartin Marietta Energy Systems, Inc. - Contract No. DE-AC05-840R21400en_US
dc.format.extent8 pagesen_US
dc.format.mimetypeapplication/pdfen_US
dc.language.isoen_USen_US
dc.publisherAmerican Institute of Physicsen_US
dc.subjectThin filmsen_US
dc.subjectNiobiumen_US
dc.subjectVacanciesen_US
dc.subjectDislocationsen_US
dc.subjectElasticityen_US
dc.titleX‐ray diffuse scattering from a nitrogen‐implanted niobium filmen_US
dc.typeArticleen_US
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/69/12/10.1063/1.347460en_US
dc.date.accessed2015-04-24en_US
dc.title.serialJournal of Applied Physicsen_US
dc.identifier.doihttps://doi.org/10.1063/1.347460
dc.type.dcmitypeTexten_US


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