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dc.contributorVirginia Tech. Department of Materials Science and Engineeringen_US
dc.contributor.authorLi, Menghuien_US
dc.contributor.authorGao, Junqien_US
dc.contributor.authorWang, Yaojinen_US
dc.contributor.authorGray, Daviden_US
dc.contributor.authorLi, Jiefangen_US
dc.contributor.authorViehland, Dwight D.en_US
dc.date.accessioned2015-05-21T19:47:23Z
dc.date.available2015-05-21T19:47:23Z
dc.date.issued2012-05-15
dc.identifier.citationLi, M. G., Junqi, Wang, Yaojin, Gray, David, Li, Jiefang, Viehland, D. (2012). Enhancement in magnetic field sensitivity and reduction in equivalent magnetic noise by magnetoelectric laminate stacks. Journal of Applied Physics, 111(10). doi: 10.1063/1.4718441en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/10919/52420
dc.description.abstractWe have investigated the equivalent magnetic noise and magnetic field sensitivity for a magnetoelectric (ME) sensor unit of N numbers of ME laminates stacked together. Our results show with increasing N that the modeled and measured equivalent magnetic noises decreased by a factor of root N and that the magnetic field sensitivities increased by root N. For Metglas/Pb(Mg-1/3,Nb-2/3) O-3-PbTiO3 laminates, the equivalent magnetic noise decreased and the magnetic field sensitivity increased by a factors of 2.1 and 2.3, respectively, for N = 4 relative to that for N = 1. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4718441]en_US
dc.format.extent4 pagesen_US
dc.format.mimetypeapplication/pdfen_US
dc.language.isoen_USen_US
dc.publisherAmerican Institute of Physicsen_US
dc.subjectMagnetic field sensorsen_US
dc.subjectLaminatesen_US
dc.subjectMagnetic fieldsen_US
dc.subject1/f noiseen_US
dc.subjectRandom noiseen_US
dc.titleEnhancement in magnetic field sensitivity and reduction in equivalent magnetic noise by magnetoelectric laminate stacksen_US
dc.typeArticleen_US
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/111/10/10.1063/1.4718441en_US
dc.date.accessed2015-04-24en_US
dc.title.serialJournal of Applied Physicsen_US
dc.identifier.doihttps://doi.org/10.1063/1.4718441
dc.type.dcmitypeTexten_US


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