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dc.contributorVirginia Tech. Department of Materials Science and Engineeringen_US
dc.contributor.authorAsryan, Levon V.en_US
dc.date.accessioned2015-05-21T19:47:25Z
dc.date.available2015-05-21T19:47:25Z
dc.date.issued2006-01-01
dc.identifier.citationAsryan, L. V. (2006). Limitations on standard procedure of determining internal loss and efficiency in quantum dot lasers. Journal of Applied Physics, 99(1). doi: 10.1063/1.2159072en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/10919/52436
dc.description.abstractLimitations are discussed on the use in quantum dot (QD) lasers of the conventional method of determining internal loss coefficient alpha(int) and internal quantum efficiency eta(int) from a measured plot of the reciprocal slope efficiency versus the cavity length L. The limitations are imposed by the L-dependence of alpha(int) and eta(int) themselves. The effect of internal loss is quantitatively analyzed, which originates from the dependence of alpha(int) on the carrier density, with the latter being L-dependent. In short cavities, a plot of the reciprocal slope efficiency versus L can significantly deviate from a straight line, thus limiting the practicality of the standard procedure. For L longer than several hundred mu m, the limitations are strong in a single-QD-layer laser and moderate in a multiple-QD-layer laser. (c) 2006 American Institute of Physics.en_US
dc.description.sponsorshipUnited States. Army Research Office - Grant No. W911-NF-05-1-0308en_US
dc.format.extent5 pagesen_US
dc.format.mimetypeapplication/pdfen_US
dc.language.isoen_USen_US
dc.publisherAmerican Institute of Physicsen_US
dc.subjectQuantum dotsen_US
dc.subjectQuantum wellsen_US
dc.subjectCarrier densityen_US
dc.subjectLaser resonatorsen_US
dc.subjectCharge injectionen_US
dc.titleLimitations on standard procedure of determining internal loss and efficiency in quantum dot lasersen_US
dc.typeArticleen_US
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/99/1/10.1063/1.2159072en_US
dc.date.accessed2015-04-24en_US
dc.title.serialJournal of Applied Physicsen_US
dc.identifier.doihttps://doi.org/10.1063/1.2159072
dc.type.dcmitypeTexten_US


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