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dc.contributorVirginia Tech. Department of Mechanical Engineeringen
dc.contributorVirginia Tech. Bradley Department of Electrical and Computer Engineeringen
dc.contributor.authorWu, X.en
dc.contributor.authorThomas, J. R.en
dc.contributor.authorDavis, William A.en
dc.date.accessioned2015-05-26T22:32:23Zen
dc.date.available2015-05-26T22:32:23Zen
dc.date.issued2002-09-15en
dc.identifier.citationWu, X., Thomas, J. R. & Davis, W. A. (2002). Control of thermal runaway in microwave resonant cavities. Journal of Applied Physics, 92(6), 3374-3380. doi: 10.1063/1.1501744en
dc.identifier.issn0021-8979en
dc.identifier.urihttp://hdl.handle.net/10919/52620en
dc.description.abstractThis article reports direct experimental evidence of the so-called "S curve" of temperature versus electrical field strength when materials with positive temperature dependence of dielectric loss are heated in a microwave resonant cavity applicator. A complete discussion of how the experimental results were achieved is presented. From the experimental results, we believe the S curve theory provides an incomplete explanation of thermal runaway in microwave heating. To understand microwave heating in a resonant cavity, cavity effects must be considered. To explain the experimental results, a theoretical model based on single-mode waveguide theory is developed. Finally, a method to control thermal runaway is described. (C) 2002 American Institute of Physics.en
dc.format.extent8 pagesen
dc.format.mimetypeapplication/pdfen
dc.language.isoen_USen
dc.publisherAmerican Institute of Physicsen
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectMicrowavesen
dc.subjectCavitationen
dc.subjectDielectric lossen
dc.subjectDielectric materialsen
dc.subjectStress strain relationsen
dc.titleControl of thermal runaway in microwave resonant cavitiesen
dc.typeArticle - Refereeden
dc.contributor.departmentMechanical Engineeringen
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/92/6/10.1063/1.1501744en
dc.date.accessed2015-04-24en
dc.title.serialJournal of Applied Physicsen
dc.identifier.doihttps://doi.org/10.1063/1.1501744en
dc.type.dcmitypeTexten


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