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    • Residual strain gradients in a fully stabilized zirconia sample 

      Hwang, Bing; Houska, Charles R.; Ice, Gene E.; Habenschuss, Anthony (American Institute of Physics, 1988-06-01)
      Polished and severely ground fully stabilized zirconia samples are examined using primarily x‐ray diffraction(XRD). The XRD (111) profile reflections from both samples were broadened asymmetrically compared to that of an ...