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X‐ray diffuse scattering from a nitrogen‐implanted niobium film
(American Institute of Physics, 1991-06-15)
A 2500-angstrom niobium single-crystal film was deposited onto a sapphire substrate and subsequently implanted with nitrogen to an average concentration of 0.5 at. %. Synchrotron radiation was used to measure the difference ...
Residual strain gradients in a fully stabilized zirconia sample
(American Institute of Physics, 1988-06-01)
Polished and severely ground fully stabilized zirconia samples are examined using primarily x‐ray diffraction(XRD). The XRD (111) profile reflections from both samples were broadened asymmetrically compared to that of an ...