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    • Method and apparatus for evanescent filed measuring of particle-solid separation 

      Virginia Tech Intellectual Properties, Inc.; Walz, John C.; Ducker, William; Clark, Spencer (United States Patent and Trademark Office, 2007-06-26)
      Evanescent wave scattering by a scanning probe in a scanning probe microscope is utilized to determine and monitor separation between a scanning probe and a sample. A laser light is totally internally reflected at the ...