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dc.contributor.authorHaislett, David W.en_US
dc.date.accessioned2017-01-30T21:02:19Z
dc.date.available2017-01-30T21:02:19Z
dc.date.issued1982en_US
dc.identifier.urihttp://hdl.handle.net/10919/74474
dc.format.extentvi, 327, [1] leavesen_US
dc.format.mimetypeapplication/pdfen_US
dc.language.isoen_USen_US
dc.publisherVirginia Polytechnic Institute and State Universityen_US
dc.rightsThe authors of the theses and dissertations are the copyright owners. Virginia Techs Digital Library and Archives has their permission to store and provide access to these works.en_US
dc.subject.lccLD5655.V855 1982.H347en_US
dc.subject.lcshMicroprocessors -- Testingen_US
dc.titleA methodology for self-testing microprocessorsen_US
dc.typeThesisen_US
dc.contributor.departmentElectrical Engineeringen_US
dc.description.degreeM.S.en_US
dc.identifier.oclc8706457en_US
thesis.degree.nameM.S.en_US
thesis.degree.levelmastersen_US
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen_US
dc.type.dcmitypeTexten_US


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