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dc.contributorCouncil on Technology Teacher Education and the International Technology and Engineering Educators Associationen
dc.contributor.authorHaynie, William J., IIIen
dc.date.accessioned2011-07-25T15:22:24Zen
dc.date.available2011-07-25T15:22:24Zen
dc.date.issued1994en
dc.identifier.citationJournal of Technology Education 6(1): (Fall 1994)en
dc.identifier.otherhaynie.pdfen
dc.identifier.urihttp://hdl.handle.net/10919/8569en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherCouncil on Technology Teacher Education and the International Technology and Engineering Educators Associationen
dc.publisherVirginia Tech. Digital Library and Archivesen
dc.relation.ispartofVolume 6 Issue 1 (fall 1994)en
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.source.urihttp://scholar.lib.vt.edu/ejournals/JTE/v6n1/pdf/haynie.pdfen
dc.titleEffects of Multiple-Choice and Short-Answer Tests on Delayed Retention Learningen
dc.typeArticle - Refereeden
dc.description.versionPublished versionen
dc.title.serialJournal of Technology Educationen
dc.type.dcmitypeTexten


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