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dc.contributor.authorGao, Minen
dc.contributor.authorViswan, Ravindranathen
dc.contributor.authorTang, Xiaoen
dc.contributor.authorLeung, Chung Mingen
dc.contributor.authorLi, Jiefangen
dc.contributor.authorViehland, Dwight D.en
dc.date.accessioned2018-12-21T14:55:34Zen
dc.date.available2018-12-21T14:55:34Zen
dc.date.issued2018-01-10en
dc.identifier.issn2045-2322en
dc.identifier.other323en
dc.identifier.urihttp://hdl.handle.net/10919/86492en
dc.description.abstractThe coupling between the tetragonal phase (T-phase) of BiFeO3 (BFO) and CoFe2O4 (CFO) in magnetoelectric heterostructures has been studied. Bilayers of CFO and BFO were deposited on (001) LaAlO3 single crystal substrates by pulsed laser deposition. After 30 min of annealing, the CFO top layer exhibited a T-phase-like structure, developing a platform-like morphology with BFO. Magnetic hysteresis loops exhibited a strong thickness effect of the CFO layer on the coercive field, in particular along the out-of-plane direction. Magnetic force microscopy images revealed that the T-phase CFO platform contained multiple magnetic domains, which could be tuned by applying a tip bias. A combination of shape, strain, and exchange coupling effects are used to explain the observations.en
dc.description.sponsorshipU.S. Department of Energy [DE-FG02-06ER46290]; Air Force Office of Scientific Research [FA9550-16-1-0001]en
dc.format.extent7 pagesen
dc.format.mimetypeapplication/pdfen
dc.language.isoen_USen
dc.publisherSpringer Natureen
dc.rightsCreative Commons Attribution 4.0 Internationalen
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en
dc.subjectexchange biasen
dc.subjectnanostructuresen
dc.subjectfilmsen
dc.titleMagnetoelectricity of CoFe2O4 and tetragonal phase BiFeO3 nanocomposites prepared by pulsed laser depositionen
dc.typeArticle - Refereeden
dc.contributor.departmentMaterials Science and Engineering (MSE)en
dc.description.notesThis work was supported by the U.S. Department of Energy under contract DE-FG02-06ER46290 (MG and DDV), and by the Air Force Office of Scientific Research under contract FA9550-16-1-0001 (JFL). The authors also thank Dr. Christopher Winkler of the ICTAS Nanoscale Characterization and Fabrication Laboratory, Virginia Tech for the assistance of the TEM measurement.en
dc.title.serialScientific Reportsen
dc.identifier.doihttps://doi.org/10.1038/s41598-017-18788-8en
dc.identifier.volume8en
dc.type.dcmitypeTexten
dc.identifier.pmid29321643en


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