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dc.contributor.authorGao, Min
dc.contributor.authorViswan, Ravindranath
dc.contributor.authorTang, Xiao
dc.contributor.authorLeung, Chung Ming
dc.contributor.authorLi, Jiefang
dc.contributor.authorViehland, Dwight D.
dc.date.accessioned2018-12-21T14:55:34Z
dc.date.available2018-12-21T14:55:34Z
dc.date.issued2018-01-10
dc.identifier.issn2045-2322
dc.identifier.other323
dc.identifier.urihttp://hdl.handle.net/10919/86492
dc.description.abstractThe coupling between the tetragonal phase (T-phase) of BiFeO3 (BFO) and CoFe2O4 (CFO) in magnetoelectric heterostructures has been studied. Bilayers of CFO and BFO were deposited on (001) LaAlO3 single crystal substrates by pulsed laser deposition. After 30 min of annealing, the CFO top layer exhibited a T-phase-like structure, developing a platform-like morphology with BFO. Magnetic hysteresis loops exhibited a strong thickness effect of the CFO layer on the coercive field, in particular along the out-of-plane direction. Magnetic force microscopy images revealed that the T-phase CFO platform contained multiple magnetic domains, which could be tuned by applying a tip bias. A combination of shape, strain, and exchange coupling effects are used to explain the observations.en_US
dc.description.sponsorshipU.S. Department of Energy [DE-FG02-06ER46290]; Air Force Office of Scientific Research [FA9550-16-1-0001]
dc.format.extent7 pages
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherSpringer Nature
dc.rightsCreative Commons Attribution 4.0 International
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.subjectexchange bias
dc.subjectnanostructures
dc.subjectfilms
dc.titleMagnetoelectricity of CoFe2O4 and tetragonal phase BiFeO3 nanocomposites prepared by pulsed laser depositionen_US
dc.typeArticle - Refereed
dc.description.notesThis work was supported by the U.S. Department of Energy under contract DE-FG02-06ER46290 (MG and DDV), and by the Air Force Office of Scientific Research under contract FA9550-16-1-0001 (JFL). The authors also thank Dr. Christopher Winkler of the ICTAS Nanoscale Characterization and Fabrication Laboratory, Virginia Tech for the assistance of the TEM measurement.
dc.title.serialScientific Reports
dc.identifier.doihttps://doi.org/10.1038/s41598-017-18788-8
dc.identifier.volume8
dc.type.dcmitypeText
dc.identifier.pmid29321643


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Creative Commons Attribution 4.0 International
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