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dc.contributor.authorGupta, Anil K.
dc.date.accessioned2019-07-03T16:42:37Z
dc.date.available2019-07-03T16:42:37Z
dc.date.issued1985
dc.identifier.urihttp://hdl.handle.net/10919/90932
dc.format.extentviii, 109 leaves
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherVirginia Polytechnic Institute and State University
dc.rightsThe authors of the theses and dissertations are the copyright owners. Virginia Techs Digital Library and Archives has their permission to store and provide access to these works.
dc.subject.lccLD5655.V855 1985.G867
dc.subject.lcshDigital integrated circuits -- Testing
dc.titleFunctional fault modeling and test vector development for VLSI systems
dc.typeThesis
dc.contributor.departmentElectrical Engineering
dc.description.degreeM.S.
dc.identifier.oclc12607426
thesis.degree.nameM.S.
thesis.degree.levelmasters
thesis.degree.grantorVirginia Polytechnic Institute and State University
thesis.degree.disciplineElectrical Engineering
dc.type.dcmitypeText


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