Now showing items 1-3 of 3
A built-in self-test PLA generator
(Virginia Tech, 1991-01-15)
On the design of reconfigurable ripple carry adders and carry save multipliers
(Virginia Tech, 1992-01-05)
<p>The fault location and reconfigurable designs of Ripple Carry (RC) adders and Carry Save (CS) multipliers are studied in this thesis. The proposed designs can locate a faulty cell and reconfigure the faulty array to ...
Experimental results on aliasing errors in circular BIST design
(Virginia Tech, 1991-09-15)
<p>The circular BIST design is a technique in which the existing circuit is modified, so that the processes of test generation and response compaction are carried out by the circuit being tested itself. Most response ...