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dc.contributor.authorGujar, Surabhi Satyajiten_US
dc.date.accessioned2020-02-21T07:00:34Z
dc.date.available2020-02-21T07:00:34Z
dc.date.issued2018-08-29
dc.identifier.othervt_gsexam:16937en_US
dc.identifier.urihttp://hdl.handle.net/10919/97006
dc.description.abstractNowadays, security is one of the foremost concerns as the confidence in a system is mostly dependent on its ability to protect itself against any attack. The area of Electromagnetic Fault Injection (EMFI) wherein attackers can use electromagnetic (EM) pulses to induce faults has started garnering increasing attention. It became crucial to understand EM attacks and find the best countermeasures. In this race to find countermeasures, different researchers proposed their ideas regarding the generation of EM attacks and their detection. However, it is difficult to see a universal agreement on the nature of these attacks. In this work, we take a closer look at the analysis of the primary EMFI fault models suggested earlier. Initial studies had shown that EM glitches caused timing violations, but recently it was proposed that EM attacks can create bit sets and bit resets. We performed a detailed experimental evaluation of the existing detection schemes on two different FPGA platforms. We present their comparative design analysis concerning their accuracy, precision, and cost. We propose an in situ timing sensor to overcome the disadvantages of the previously proposed detection approaches. This sensor can successfully detect most of the electromagnetic injected faults with high precision. We observed that the EM attack behaves like a localized timing attack in FPGAs which can be identified using the in situ timing sensors.en_US
dc.format.mediumETDen_US
dc.publisherVirginia Techen_US
dc.rightsIn Copyrighten
dc.rights.urihttp://rightsstatements.org/vocab/InC/1.0/en
dc.subjectHardware Securityen_US
dc.subjectFPGAen_US
dc.subjectElectromagnetic Injectionen_US
dc.subjectFault Attacksen_US
dc.titleDetecting Electromagnetic Injection Attack on FPGAs Using In Situ Timing Sensorsen_US
dc.typeThesisen_US
dc.contributor.departmentElectrical and Computer Engineeringen_US
dc.description.degreeMSen_US
thesis.degree.nameMSen_US
thesis.degree.levelmastersen_US
thesis.degree.grantorVirginia Polytechnic Institute and State Universityen_US
thesis.degree.disciplineComputer Engineeringen_US
dc.contributor.committeechairNazhandali, Leylaen_US
dc.contributor.committeememberAbbott, Amos L.en_US
dc.contributor.committeememberSchaumont, Patrick Roberten_US


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