Virginia Tech. Macromolecular Science and EngineeringVirginia Tech. Department of PhysicsSweet Briar College. Department of Physics and EngineeringUniversity of California, Los Angeles. Department of Physics and AstronomyJain, VaibhavYochum, Henry M.Montazami, RezaHeflin, James R.Hu, LiangbingGruner, George2015-05-052015-05-052008-04-01Jain, Vaibhav, Yochum, Henry M., Montazami, Reza, Heflin, James R., Hu, Liangbing, Gruner, George (2008). Modification of single-walled carbon nanotube electrodes by layer-by-layer assembly for electrochromic devices. Journal of Applied Physics, 103(7). doi: 10.1063/1.28912560021-8979http://hdl.handle.net/10919/52015We have studied the morphological properties and electrochromic (EC) performance of polythiophene multilayer films on single wall carbon nanotube (SWCNT) conductive electrodes. The morphology for different numbers of layer-by-layer (LbL) bilayer on the SWCNT electrode has been characterized with atomic force microscopy and scanning electron microscope, and it was found that the LbL multilayers significantly decrease the surface roughness of the nanoporous nanotube films. The controlled surface roughness of transparent nanotube electrodes could be beneficial for their device applications. We have also fabricated EC devices with LbL films of poly[2-(3-thienyl) ethoxy-4-butylsulfonate/poly(allylamine hydrochloride) on SWCNT electrodes, which not only have high EC contrast but also sustain higher applied voltage without showing any degradation for more than 20 000 cycles, which is not possible in the case of indium tin oxide electrodes. Cyclic voltammetry of the LbL films formed on SWCNT shows higher current at low potential, revealing the feasibility of SWCNT electrode as a good host for electrolyte ion insertion. (C) 2008 American Institute of Physics.6 pagesapplication/pdfen-USIn CopyrightCarbon nanotubesElectrodesThin filmsThin film devicesElectrodepositionModification of single-walled carbon nanotube electrodes by layer-by-layer assembly for electrochromic devicesArticle - Refereedhttp://scitation.aip.org/content/aip/journal/jap/103/7/10.1063/1.2891256Journal of Applied Physicshttps://doi.org/10.1063/1.2891256