Palani, Purushothaman2024-06-062024-06-062024-06-05vt_gsexam:40727https://hdl.handle.net/10919/119322ETDenIn CopyrightDDR4DRAMPUFFPGAXilinxMagnetic Fielddecayretention analysisbit flipsCharacterizing Retention behavior of DDR4 SoDIMMThesis