Melville, Robert C.Moinian, ShahriarFeldman, PeterWatson, Layne T.2013-06-192013-06-191992http://hdl.handle.net/10919/19778In this paper we describe an experimental system called sframe which is being incorporated into the design for manufacturability initiative at the Reading Works of AT&T Bell Laboratories. Our system is able to perform detailed and accurate DC analyses of integrated circuits containing several hundred transistors to be fabricated in a relatively complex junction isolated complementary technology.application/pdfenIn CopyrightTechnical reportTR-92-52http://eprints.cs.vt.edu/archive/00000332/01/TR-92-52.pdf