Virginia TechYan, LiXing, ZengpingWang, Z. G.Wang, T.Lei, G. Y.Li, JiefangViehland, Dwight D.2014-01-282014-01-282009-05-01Yan, Li; Xing, Zengping; Wang, Zhiguang; et al., "Direct measurement of magnetoelectric exchange in self-assembled epitaxial BiFeO3-CoFe2O4 nanocomposite thin films," Appl. Phys. Lett. 94, 192902 (2009); http://dx.doi.org/10.1063/1.31381380003-6951http://hdl.handle.net/10919/25163We report the direct measurement of a magnetoelectric (ME) exchange between magnetostrictive CoFe2O4 nanopillars in a piezoelectric BiFeO3 matrix for single-layer nanocomposite epitaxial thin films grown on (001) SrTiO3 substrates with SrRuO3 bottom electrodes. The ME coefficient was measured by a magnetic cantilever method and had a maximum value of similar to 20 mV/cm Oe. The films possessed saturation polarization (60 mu C/cm(2)) and magnetization (410 emu/cc) properties equivalent to bulk values, with typical hysteresis loops.application/pdfen-USIn CopyrightBismuth compoundsCobalt compoundsDielectric polarisationMagneticEpitaxial layersMagnetic hysteresisMagnetoelectric effectsNanocompositesPiezoelectric thin filmsBatio3-cofe2o4 nanostructuresMultiferroic nanostructuresLaminatesComposite materialsHeterostructuresPhysicsArticle - Refereedhttp://scitation.aip.org/content/aip/journal/apl/94/19/10.1063/1.3138138https://doi.org/10.1063/1.3138138