Basehore, M. L.Post, Daniel2014-04-042014-04-041982-11-01Michael L. Basehore and Daniel Post, "Displacement fields (U,W) obtained simultaneously by moiré interferometry," Appl. Opt. 21, 2558-2562 (1982). doi: 10.1364/AO.21.0025580003-6935http://hdl.handle.net/10919/46890A high-frequency phase grating on a specimen surface is illuminated symmetrically by two oblique beams. The diffracted beams emerge with wave front warpages that define both the in-plane U and out-of-plane W displacement fields. Contour maps of these wave fronts, with added carrier fringes, are obtained as a single photographic record. They are manipulated by moiré and optical filtering steps to yield whole-field fringe patterns of U and W. Sensitivities of 0.833 _m/fringe (32.8 _in./fringe) for in-plane displacements and 0.132 _m/fringe (5.2 _m./fringe) for out-of-plane displacements were demonstrated. Since data acquisition is experimentally simple, dynamic as well as static analyses are applicable.application/pdfen-USIn CopyrightArticle - Refereedhttp://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-21-14-2558https://doi.org/10.1364/AO.21.002558